Dynamical calculation for X-ray 24-beam diffraction in a two-plate crystal cavity of silicon

The X‐ray back diffraction of (1240) in a monolithic two‐plate silicon cavity occurs at photon energy 14.4388 keV, at which 24 beams are simultaneously excited. Based on the dynamical theory of X‐ray diffraction, a theoretical approach has been developed for solving the fundamental equation of dynam...

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Veröffentlicht in:	Acta crystallographica. Section A, Foundations of crystallography Foundations of crystallography, 2008-05, Vol.64 (3), p.394-403
Hauptverfasser:	Chiu, M.-S., Stetsko, Yu. P., Chang, S.-L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Crystal structure Crystallography Diffraction dynamical effects multiple diffraction Silicon Theory X-ray cavity X-rays
Online-Zugang:	Volltext
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