Dynamical calculation for X-ray 24-beam diffraction in a two-plate crystal cavity of silicon

The X‐ray back diffraction of (1240) in a monolithic two‐plate silicon cavity occurs at photon energy 14.4388 keV, at which 24 beams are simultaneously excited. Based on the dynamical theory of X‐ray diffraction, a theoretical approach has been developed for solving the fundamental equation of dynamical theory to investigate this back diffraction and the interference patterns generated by the Fabry–Perot‐type resonance that produces intensity undulation in both transmitted and back‐reflected beams. The section of dispersion surface and its associated linear absorption coefficients, wavefield intensities and excitation of mode are calculated. The calculated intensity distribution of the transmitted beam is in a good agreement with the observed one. Details about the interaction between the multiply diffracted X‐rays and cavity resonant photons are also reported. Procedures of computer programming are also provided.