Photodissociation of Metal−Silicon Clusters:  Encapsulated versus Surface-Bound Metal

Metal−silicon cluster cations of the form MSi n + (M = Cu, Ag, Cr) are produced in a molecular beam with pulsed laser vaporization. These species are mass-selected in a reflectron time-of-flight spectrometer and studied with laser photodissociation at 532 and 355 nm. For the noble metals copper and silver, photodissociation of the n = 7 and 10 clusters proceeds primarily by the loss of metal atoms, indicating that the metal is not located within the interior of silicon cages, and that metal−silicon bonding is weaker than silicon−silicon bonding. Chromium−silicon clusters for n = 7 also lose primarily the metal atom, but at n = 15 and 16 these dissociate via the loss of silicon, producing smaller metal−silicon species. This behavior is consistent with stronger metal−silicon bonding and encapsulated metal structures, as suggested previously by theory. MSi6 + cations are produced efficiently in all of these photodissociation processes, indicating that these species have enhanced stability compared to other small clusters. Improved values are obtained for the ionization potentials of Si7 and Si10.