Quantitative Determination of Low-Z Elements in Single Atmospheric Particles on Boron Substrates by Automated Scanning Electron Microscopy−Energy-Dispersive X-ray Spectrometry

Atmospheric aerosols consist of a complex heterogeneous mixture of particles. Single-particle analysis techniques are known to provide unique information on the size-resolved chemical composition of aerosols. A scanning electron microscope (SEM) combined with a thin-window energy-dispersive X-ray (E...

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Veröffentlicht in:Analytical chemistry (Washington) 2005-09, Vol.77 (17), p.5686-5692
Hauptverfasser: Choël, Marie, Deboudt, Karine, Osán, János, Flament, Pascal, Van Grieken, René
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Sprache:eng
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Zusammenfassung:Atmospheric aerosols consist of a complex heterogeneous mixture of particles. Single-particle analysis techniques are known to provide unique information on the size-resolved chemical composition of aerosols. A scanning electron microscope (SEM) combined with a thin-window energy-dispersive X-ray (EDX) detector enables the morphological and elemental analysis of single particles down to 0.1 μm with a detection limit of 1−10 wt %, low-Z elements included. To obtain data statistically representative of the air masses sampled, a computer-controlled procedure can be implemented in order to run hundreds of single-particle analyses (typically 1000−2000) automatically in a relatively short period of time (generally 4−8 h, depending on the setup and on the particle loading). However, automated particle analysis by SEM−EDX raises two practical challenges:  the accuracy of the particle recognition and the reliability of the quantitative analysis, especially for micrometer-sized particles with low atomic number contents. Since low-Z analysis is hampered by the use of traditional polycarbonate membranes, an alternate choice of substrate is a prerequisite. In this work, boron is being studied as a promising material for particle microanalysis. As EDX is generally said to probe a volume of approximately 1 μm3, geometry effects arise from the finite size of microparticles. These particle geometry effects must be corrected by means of a robust concentration calculation procedure. Conventional quantitative methods developed for bulk samples generate elemental concentrations considerably in error when applied to microparticles. A new methodology for particle microanalysis, combining the use of boron as the substrate material and a reverse Monte Carlo quantitative program, was tested on standard particles ranging from 0.25 to 10 μm. We demonstrate that the quantitative determination of low-Z elements in microparticles is achievable and that highly accurate results can be obtained using the automatic data processing described here compared to conventional methods.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac050739x