Graphene Thickness Determination Using Reflection and Contrast Spectroscopy
We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (
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| Veröffentlicht in: | Nano letters 2007-09, Vol.7 (9), p.2758-2763 |
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| container_end_page | 2763 |
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| container_issue | 9 |
| container_start_page | 2758 |
| container_title | Nano letters |
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| creator | Ni, Z. H Wang, H. M Kasim, J Fan, H. M Yu, T Wu, Y. H Feng, Y. P Shen, Z. X |
| description | We have clearly discriminated the single-, bilayer-, and multiple-layer graphene ( |
| doi_str_mv | 10.1021/nl071254m |
| format | Article |
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We also show that the refractive index of graphene is different from that of graphite. 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H</creatorcontrib><creatorcontrib>Wang, H. M</creatorcontrib><creatorcontrib>Kasim, J</creatorcontrib><creatorcontrib>Fan, H. M</creatorcontrib><creatorcontrib>Yu, T</creatorcontrib><creatorcontrib>Wu, Y. H</creatorcontrib><creatorcontrib>Feng, Y. P</creatorcontrib><creatorcontrib>Shen, Z. X</creatorcontrib><title>Graphene Thickness Determination Using Reflection and Contrast Spectroscopy</title><title>Nano letters</title><addtitle>Nano Lett</addtitle><description>We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (<10 layers) on Si substrate with a 285 nm SiO2 capping layer by using contrast spectra, which were generated from the reflection light of a white light source. Calculations based on Fresnel's law are in excellent agreement with the experimental results (deviation 2%). The contrast image shows the reliability and efficiency of this new technique. The contrast spectrum is a fast, nondestructive, easy to be carried out, and unambiguous way to identify the numbers of layers of graphene sheet. We provide two easy-to-use methods to determine the number of graphene layers based on contrast spectra: a graphic method and an analytical method. We also show that the refractive index of graphene is different from that of graphite. 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H</creator><creator>Wang, H. M</creator><creator>Kasim, J</creator><creator>Fan, H. M</creator><creator>Yu, T</creator><creator>Wu, Y. H</creator><creator>Feng, Y. P</creator><creator>Shen, Z. X</creator><general>American Chemical Society</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20070901</creationdate><title>Graphene Thickness Determination Using Reflection and Contrast Spectroscopy</title><author>Ni, Z. H ; Wang, H. M ; Kasim, J ; Fan, H. M ; Yu, T ; Wu, Y. H ; Feng, Y. P ; Shen, Z. 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X</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Graphene Thickness Determination Using Reflection and Contrast Spectroscopy</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2007-09-01</date><risdate>2007</risdate><volume>7</volume><issue>9</issue><spage>2758</spage><epage>2763</epage><pages>2758-2763</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (<10 layers) on Si substrate with a 285 nm SiO2 capping layer by using contrast spectra, which were generated from the reflection light of a white light source. Calculations based on Fresnel's law are in excellent agreement with the experimental results (deviation 2%). The contrast image shows the reliability and efficiency of this new technique. The contrast spectrum is a fast, nondestructive, easy to be carried out, and unambiguous way to identify the numbers of layers of graphene sheet. 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| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Fullerenes and related materials diamonds, graphite Graphite - chemistry Macromolecular Substances - chemistry Materials science Materials Testing - methods Molecular Conformation Nanostructures - chemistry Nanostructures - ultrastructure Nanotechnology - methods Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures Particle Size Photometry - methods Physics Refractometry - methods Reproducibility of Results Sensitivity and Specificity Specific materials Spectrum Analysis - methods Surface Properties |
| title | Graphene Thickness Determination Using Reflection and Contrast Spectroscopy |
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