Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (

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Bibliographische Detailangaben
Veröffentlicht in:	Nano letters 2007-09, Vol.7 (9), p.2758-2763
Hauptverfasser:	Ni, Z. H, Wang, H. M, Kasim, J, Fan, H. M, Yu, T, Wu, Y. H, Feng, Y. P, Shen, Z. X
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Fullerenes and related materials diamonds, graphite Graphite - chemistry Macromolecular Substances - chemistry Materials science Materials Testing - methods Molecular Conformation Nanostructures - chemistry Nanostructures - ultrastructure Nanotechnology - methods Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures Particle Size Photometry - methods Physics Refractometry - methods Reproducibility of Results Sensitivity and Specificity Specific materials Spectrum Analysis - methods Surface Properties
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Beschreibung
Zusammenfassung:	We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (
ISSN:	1530-6984 1530-6992
DOI:	10.1021/nl071254m