The preferred CSL misorientation distribution in polycrystalline SrTiO3

The preferred CSL misorientation distribution in polycrystalline SrTiO3

Summary Electron backscattered diffraction is used to investigate the preferred CSL (coincidence site lattice) distribution of polycrystalline SrTiO3 as a function of annealing times (1 h and 16 h). Comparison of the CSL misorientations suggests that the CSL boundary energy plays a role in the prefe...

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Veröffentlicht in:Journal of microscopy (Oxford) 2007-09, Vol.227 (3), p.292-297
Hauptverfasser: PARK, MYUNG‐BEOM, SHIH, SHAO‐JU, COCKAYNE, DAVID J. H.
Format: Artikel
Sprache:eng
Schlagworte:
Coincidence site lattice
electron backscattered diffraction
misorientation
SrTiO3
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Zusammenfassung:Summary Electron backscattered diffraction is used to investigate the preferred CSL (coincidence site lattice) distribution of polycrystalline SrTiO3 as a function of annealing times (1 h and 16 h). Comparison of the CSL misorientations suggests that the CSL boundary energy plays a role in the preferred grain growth.
ISSN:0022-2720
1365-2818
DOI:10.1111/j.1365-2818.2007.01813.x