Inverse scattering for high-resolution interferometric microscopy

We extend the applicability of inverse scattering for optical coherence tomography (OCT) to the case of high numerical aperture focusing optics. We include the effects of tight focusing so that the approach is applicable to any interferometric microscopy method. The applicability to modalities, such...

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Veröffentlicht in:Optics letters 2006-12, Vol.31 (24), p.3585-3587
Hauptverfasser: RALSTON, Tyler S, MARKS, Daniel L, BOPPART, Stephen A, CARNEY, P. Scott
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container_issue 24
container_start_page 3585
container_title Optics letters
container_volume 31
creator RALSTON, Tyler S
MARKS, Daniel L
BOPPART, Stephen A
CARNEY, P. Scott
description We extend the applicability of inverse scattering for optical coherence tomography (OCT) to the case of high numerical aperture focusing optics. We include the effects of tight focusing so that the approach is applicable to any interferometric microscopy method. The applicability to modalities, such as OCT and optical coherence microscopy, enables computed reconstruction of three-dimensional volumes from en face temporal ranging data. Simulations show that the computed structure outside of the focal plane exhibits spatially invariant resolution on par with the resolution achieved at the focal plane.
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source MEDLINE; Optica Publishing Group Journals
subjects Algorithms
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Image Enhancement - methods
Image forming and processing
Image Interpretation, Computer-Assisted - methods
Image reconstruction
tomography
Imaging and optical processing
Imaging, Three-Dimensional - methods
Microscopy, Interference - methods
Optics
Physics
Reproducibility of Results
Scattering, Radiation
Sensitivity and Specificity
Tomography, Optical Coherence - methods
title Inverse scattering for high-resolution interferometric microscopy
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