Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam
Summary A database of 416 wavelength‐ and energy‐dispersive EPMA measurements on tilted specimens of NiAl, TiO2 and Ti3Al is presented. The analyses were performed between 10 and 30 kV and the tilt angles were varied between 0° and 60° in seven steps. The necessary hardware modifications for the spe...
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| Veröffentlicht in: | Journal of microscopy (Oxford) 2006-10, Vol.224 (1), p.52-57 |
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| container_title | Journal of microscopy (Oxford) |
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| creator | BASTIN, G. F. OBERNDORFF, P. J. T. L. HEIJLIGERS, H. J. M. DIJKSTRA, J. M. |
| description | Summary
A database of 416 wavelength‐ and energy‐dispersive EPMA measurements on tilted specimens of NiAl, TiO2 and Ti3Al is presented. The analyses were performed between 10 and 30 kV and the tilt angles were varied between 0° and 60° in seven steps. The necessary hardware modifications for the specimen holder are discussed, as well as the various focusing techniques used in the measurements. A comparison between the experimental data, the calculations of our proza96t program and the results of Monte Carlo simulations shows that up to 50° tilt the predictions of our software are more than satisfactory. At larger tilt angles some deviations become noticeable. The Monte Carlo simulations appear to produce deviations at a somewhat earlier stage already, for reasons as yet unknown. |
| doi_str_mv | 10.1111/j.1365-2818.2006.01662.x |
| format | Article |
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A database of 416 wavelength‐ and energy‐dispersive EPMA measurements on tilted specimens of NiAl, TiO2 and Ti3Al is presented. The analyses were performed between 10 and 30 kV and the tilt angles were varied between 0° and 60° in seven steps. The necessary hardware modifications for the specimen holder are discussed, as well as the various focusing techniques used in the measurements. A comparison between the experimental data, the calculations of our proza96t program and the results of Monte Carlo simulations shows that up to 50° tilt the predictions of our software are more than satisfactory. At larger tilt angles some deviations become noticeable. The Monte Carlo simulations appear to produce deviations at a somewhat earlier stage already, for reasons as yet unknown.</description><identifier>ISSN: 0022-2720</identifier><identifier>EISSN: 1365-2818</identifier><identifier>DOI: 10.1111/j.1365-2818.2006.01662.x</identifier><identifier>PMID: 17100906</identifier><language>eng</language><publisher>Oxford, UK: Blackwell Publishing Ltd</publisher><subject>Electron microscopy ; electron probe ; EPMA on tilted specimens</subject><ispartof>Journal of microscopy (Oxford), 2006-10, Vol.224 (1), p.52-57</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3672-a40e0cfba9df27d5b1eedf8ee66ad2eb286eeffab891c419ea0e5540c425b23f3</citedby><cites>FETCH-LOGICAL-c3672-a40e0cfba9df27d5b1eedf8ee66ad2eb286eeffab891c419ea0e5540c425b23f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1111%2Fj.1365-2818.2006.01662.x$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1111%2Fj.1365-2818.2006.01662.x$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,1427,27901,27902,45550,45551,46384,46808</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/17100906$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>BASTIN, G. F.</creatorcontrib><creatorcontrib>OBERNDORFF, P. J. T. L.</creatorcontrib><creatorcontrib>HEIJLIGERS, H. J. M.</creatorcontrib><creatorcontrib>DIJKSTRA, J. M.</creatorcontrib><title>Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam</title><title>Journal of microscopy (Oxford)</title><addtitle>J Microsc</addtitle><description>Summary
A database of 416 wavelength‐ and energy‐dispersive EPMA measurements on tilted specimens of NiAl, TiO2 and Ti3Al is presented. The analyses were performed between 10 and 30 kV and the tilt angles were varied between 0° and 60° in seven steps. The necessary hardware modifications for the specimen holder are discussed, as well as the various focusing techniques used in the measurements. A comparison between the experimental data, the calculations of our proza96t program and the results of Monte Carlo simulations shows that up to 50° tilt the predictions of our software are more than satisfactory. At larger tilt angles some deviations become noticeable. The Monte Carlo simulations appear to produce deviations at a somewhat earlier stage already, for reasons as yet unknown.</description><subject>Electron microscopy</subject><subject>electron probe</subject><subject>EPMA on tilted specimens</subject><issn>0022-2720</issn><issn>1365-2818</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqNkcFuEzEURS0EomnhF5BXCBYzPHsyjrNgUVUBihrRBYil5bGfG0cznmDPtM2OL6j4Rr4EDwmwxRvb8r3nyfcSQhmULK8325JVoi64ZLLkAKIEJgQv7x-R2d-Hx2QGwHnBFxxOyGlKWwCQtYSn5IQtGMASxIw8fNW32GK4GTY_v_-gOliKAePNPt-sTzuMyd8iXbVohtgHeh37Bunam9jroNt98om-Wl2vz1_TDnUaI3YYhkTv_LChoQ8Zkxk7DNabsdWR-mC8xWCQ9o4OG6T4B92g7p6RJ063CZ8f9zPy5d3q88WH4urT-8uL86vCVGLBCz0HBOMavbSOL2zdMETrJKIQ2nJsuBSIzulGLpmZsyVqwLqeg5nzuuGVq87IywN3F_tvI6ZBdT4ZbFsdsB-TEpJlW8WyUB6E-cMpRXRqF32n414xUFMXaqumyNUUuZq6UL-7UPfZ-uI4Y2w6tP-Mx_Cz4O1BcOdb3P83WH1cX06n6hefrp7o</recordid><startdate>200610</startdate><enddate>200610</enddate><creator>BASTIN, G. F.</creator><creator>OBERNDORFF, P. J. T. L.</creator><creator>HEIJLIGERS, H. J. M.</creator><creator>DIJKSTRA, J. M.</creator><general>Blackwell Publishing Ltd</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>200610</creationdate><title>Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam</title><author>BASTIN, G. F. ; OBERNDORFF, P. J. T. L. ; HEIJLIGERS, H. J. M. ; DIJKSTRA, J. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3672-a40e0cfba9df27d5b1eedf8ee66ad2eb286eeffab891c419ea0e5540c425b23f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Electron microscopy</topic><topic>electron probe</topic><topic>EPMA on tilted specimens</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>BASTIN, G. F.</creatorcontrib><creatorcontrib>OBERNDORFF, P. J. T. L.</creatorcontrib><creatorcontrib>HEIJLIGERS, H. J. M.</creatorcontrib><creatorcontrib>DIJKSTRA, J. M.</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of microscopy (Oxford)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>BASTIN, G. F.</au><au>OBERNDORFF, P. J. T. L.</au><au>HEIJLIGERS, H. J. M.</au><au>DIJKSTRA, J. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam</atitle><jtitle>Journal of microscopy (Oxford)</jtitle><addtitle>J Microsc</addtitle><date>2006-10</date><risdate>2006</risdate><volume>224</volume><issue>1</issue><spage>52</spage><epage>57</epage><pages>52-57</pages><issn>0022-2720</issn><eissn>1365-2818</eissn><abstract>Summary
A database of 416 wavelength‐ and energy‐dispersive EPMA measurements on tilted specimens of NiAl, TiO2 and Ti3Al is presented. The analyses were performed between 10 and 30 kV and the tilt angles were varied between 0° and 60° in seven steps. The necessary hardware modifications for the specimen holder are discussed, as well as the various focusing techniques used in the measurements. A comparison between the experimental data, the calculations of our proza96t program and the results of Monte Carlo simulations shows that up to 50° tilt the predictions of our software are more than satisfactory. At larger tilt angles some deviations become noticeable. The Monte Carlo simulations appear to produce deviations at a somewhat earlier stage already, for reasons as yet unknown.</abstract><cop>Oxford, UK</cop><pub>Blackwell Publishing Ltd</pub><pmid>17100906</pmid><doi>10.1111/j.1365-2818.2006.01662.x</doi><tpages>6</tpages></addata></record> |
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| subjects | Electron microscopy electron probe EPMA on tilted specimens |
| title | Wavelength‐ and energy‐dispersive Electron Probe Microanalysis (EPMA) measurements with non‐perpendicular incidence of the electron beam |
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