Measurement of the Adhesion Force between Carbon Nanotubes and a Silicon Dioxide Substrate

Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at...

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Veröffentlicht in:	Nano letters 2006-05, Vol.6 (5), p.953-957
Hauptverfasser:	Whittaker, Jed D., Minot, Ethan D., Tanenbaum, David M., McEuen, Paul L., Davis, Robert C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Mechanical and acoustical properties Microscopy, Atomic Force Nanoscale materials and structures: fabrication and characterization Nanotubes Nanotubes, Carbon - chemistry Other topics in nanoscale materials and structures Physical properties of thin films, nonelectronic Physics Silicon Dioxide - chemistry Static Electricity Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Beschreibung
Zusammenfassung:	Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectively coated with a silicon dioxide layer.
ISSN:	1530-6984 1530-6992
DOI:	10.1021/nl060018t