Nanomanipulator-assisted fabrication and characterization of carbon nanotubes inside scanning electron microscope

We have installed two nanomanipulators, which can travel about 20 mm with a minimum increment of 1 nm, for manipulation of nanostructured materials inside field-emission scanning electron microscope (FE-SEM). Both manipulators render motions in x, y, and z directions, providing various manipulation...

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Veröffentlicht in:Micron (Oxford, England : 1993) England : 1993), 2005-01, Vol.36 (5), p.471-476
Hauptverfasser: Lim, Seong Chu, Kim, Keun Soo, Lee, Im Bok, Jeong, Seung Yol, Cho, Shinje, Yoo, Jae-Eun, Lee, Young Hee
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Sprache:eng
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Zusammenfassung:We have installed two nanomanipulators, which can travel about 20 mm with a minimum increment of 1 nm, for manipulation of nanostructured materials inside field-emission scanning electron microscope (FE-SEM). Both manipulators render motions in x, y, and z directions, providing various manipulation freedoms such as moving, bending, cutting, and biasing. In addition, we have conducted in situ characterization of the electrical breakdown of multi-walled carbon nanotubes (MWCNTs). Our results demonstrate the possibility that MWCNTs can be used as a gas sensor.
ISSN:0968-4328
1878-4291
DOI:10.1016/j.micron.2005.03.005