Nanomanipulator-assisted fabrication and characterization of carbon nanotubes inside scanning electron microscope
We have installed two nanomanipulators, which can travel about 20 mm with a minimum increment of 1 nm, for manipulation of nanostructured materials inside field-emission scanning electron microscope (FE-SEM). Both manipulators render motions in x, y, and z directions, providing various manipulation...
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Veröffentlicht in: | Micron (Oxford, England : 1993) England : 1993), 2005-01, Vol.36 (5), p.471-476 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We have installed two nanomanipulators, which can travel about 20
mm with a minimum increment of 1
nm, for manipulation of nanostructured materials inside field-emission scanning electron microscope (FE-SEM). Both manipulators render motions in
x,
y, and
z directions, providing various manipulation freedoms such as moving, bending, cutting, and biasing. In addition, we have conducted in situ characterization of the electrical breakdown of multi-walled carbon nanotubes (MWCNTs). Our results demonstrate the possibility that MWCNTs can be used as a gas sensor. |
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ISSN: | 0968-4328 1878-4291 |
DOI: | 10.1016/j.micron.2005.03.005 |