Controlled Amine Functionality in Self-Assembled Monolayers via the Hidden Amine Route:  Chemical and Electronic Tunability

A synthetic strategy for fabricating a dense amine functionalized self-assembled monolayer (SAM) on hydroxylated surfaces is presented. The assembly steps are monitored by X-ray photoelectron spectroscopy, Fourier transform infrared- attenuated total reflection, atomic force microscopy, variable ang...

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Veröffentlicht in:The journal of physical chemistry. B 2006-04, Vol.110 (15), p.8002-8009
Hauptverfasser: Ofir, Yuval, Zenou, Noemi, Goykhman, Ilya, Yitzchaik, Shlomo
Format: Artikel
Sprache:eng
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Zusammenfassung:A synthetic strategy for fabricating a dense amine functionalized self-assembled monolayer (SAM) on hydroxylated surfaces is presented. The assembly steps are monitored by X-ray photoelectron spectroscopy, Fourier transform infrared- attenuated total reflection, atomic force microscopy, variable angle spectroscopic ellipsometry, UV−vis surface spectroscopy, contact angle wettability, and contact potential difference measurements. The method applies alkylbromide−trichlorosilane for the fabrication of the SAM followed by surface transformation of the bromine moiety to amine by a two-step procedure:  SN2 reaction that introduces the hidden amine, phthalimide, followed by the removal of the protecting group and exposing the free amine. The use of phthalimide moiety in the process enabled monitoring the substitution reaction rate on the surface (by absorption spectroscopy) and showed first-order kinetics. The simplicity of the process, nonharsh reagents, and short reaction time allow the use of such SAMs in molecular nanoelectronics applications, where complete control of the used SAM is needed. The different molecular dipole of each step of the process, which is verified by DFT calculations, supports the use of these SAMs as means to tune the electronic properties of semiconductors and for better synergism between SAMs and standard microelectronics processes and devices.
ISSN:1520-6106
1520-5207
DOI:10.1021/jp057251k