Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film

Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to...

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Veröffentlicht in:Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 2006-04, Vol.23 (4), p.960-965
1. Verfasser: AZZAM, R. M. A
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description Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to be identical, and the associated ellipsometric parameters psir, psit are governed by a simple relation, independent of film thickness. When the Fresnel interface reflection phase shifts for the p and s polarizations or their average are quarter-wave, the corresponding overall reflection phase shifts introduced by the embedded layer are also quarter-wave for all values of film thickness. In the limit of zero film thickness (i.e., for an ultrathin embedded layer), the reflection phase shifts are also quarter-wave independent of polarization (p or s) or angle of incidence (except at grazing incidence). Finally, variable-angle FTIR ellipsometry is shown to be a sensitive technique for measuring the thickness of thin uniform air gaps between transparent bulk media.
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subjects Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Optical testing techniques
Optics
Physics
Polarization
Wave optics
title Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film
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