Phase shifts in frustrated total internal reflection and optical tunneling by an embedded low-index thin film

Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to...

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Veröffentlicht in:Journal of the Optical Society of America. A, Optics, image science, and vision Optics, image science, and vision, 2006-04, Vol.23 (4), p.960-965
1. Verfasser: AZZAM, R. M. A
Format: Artikel
Sprache:eng
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Zusammenfassung:Simple and explicit expressions for the phase shifts that p- and s-polarized light experience in frustrated total internal reflection (FTIR) and optical tunneling by an embedded low-index thin film are obtained. The differential phase shifts in reflection and transmission deltar, deltat are found to be identical, and the associated ellipsometric parameters psir, psit are governed by a simple relation, independent of film thickness. When the Fresnel interface reflection phase shifts for the p and s polarizations or their average are quarter-wave, the corresponding overall reflection phase shifts introduced by the embedded layer are also quarter-wave for all values of film thickness. In the limit of zero film thickness (i.e., for an ultrathin embedded layer), the reflection phase shifts are also quarter-wave independent of polarization (p or s) or angle of incidence (except at grazing incidence). Finally, variable-angle FTIR ellipsometry is shown to be a sensitive technique for measuring the thickness of thin uniform air gaps between transparent bulk media.
ISSN:1084-7529
1520-8532
DOI:10.1364/JOSAA.23.000960