Structural, optical, and magnetic properties of Mn-doped ZnO thin film

The Zn 1 − x Mn x O ( x = 0 , 0.16, and 0.25) thin films were grown on fused quartz substrates by reactive magnetron cosputtering. X-ray-diffraction measurement revealed that all the films were single phase and had wurtzite structure with c -axis orientation. As Mn concentration increased in the Zn...

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Veröffentlicht in:The Journal of chemical physics 2006-02, Vol.124 (7), p.074707-074707-4
Hauptverfasser: Xu, H. Y., Liu, Y. C., Xu, C. S., Liu, Y. X., Shao, C. L., Mu, R.
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Sprache:eng
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Zusammenfassung:The Zn 1 − x Mn x O ( x = 0 , 0.16, and 0.25) thin films were grown on fused quartz substrates by reactive magnetron cosputtering. X-ray-diffraction measurement revealed that all the films were single phase and had wurtzite structure with c -axis orientation. As Mn concentration increased in the Zn 1 − x Mn x O films, the c -axis lattice constant and band-gap energy increased gradually. In Raman-scattering studies, an additional Mn-related vibration mode appeared at 520 cm − 1 . E 2 H phonon line of Zn 1 − x Mn x O alloy was broadened asymmetrically and redshifted as a result of microscopic structural disorder induced by Mn 2 + random substitution. The Zn 0.84 Mn 0.16 O film exhibited a ferromagnetic characteristic with a Curie temperature of ∼ 62 K . However, with increasing Mn concentration to 25 at. % , ferromagnetism disappeared due to the enhanced antiferromagnetic superexchange interactions between neighboring Mn 2 + ions.
ISSN:0021-9606
1089-7690
DOI:10.1063/1.2171308