A new approach to measuring high-resolution magnetic Compton profiles

It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method...

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Veröffentlicht in:Journal of synchrotron radiation 2006-03, Vol.13 (2), p.221-224
Hauptverfasser: Kawata, H., Sakurai, H., Shiotani, N., Watanabe, Y.
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container_title Journal of synchrotron radiation
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creator Kawata, H.
Sakurai, H.
Shiotani, N.
Watanabe, Y.
description It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds.
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subjects Compton scattering
electron momentum density
Exact sciences and technology
high-resolution measurements
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
magnetic Compton profile
Physics
X- and γ-ray instruments and techniques
X- and γ-ray sources, mirrors, gratings and detectors
title A new approach to measuring high-resolution magnetic Compton profiles
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