A new approach to measuring high-resolution magnetic Compton profiles
It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method...
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Veröffentlicht in: | Journal of synchrotron radiation 2006-03, Vol.13 (2), p.221-224 |
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container_title | Journal of synchrotron radiation |
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creator | Kawata, H. Sakurai, H. Shiotani, N. Watanabe, Y. |
description | It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds. |
doi_str_mv | 10.1107/S0909049505040562 |
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Synchrotron Rad</addtitle><description>It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds.</description><subject>Compton scattering</subject><subject>electron momentum density</subject><subject>Exact sciences and technology</subject><subject>high-resolution measurements</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>magnetic Compton profile</subject><subject>Physics</subject><subject>X- and γ-ray instruments and techniques</subject><subject>X- and γ-ray sources, mirrors, gratings and detectors</subject><issn>1600-5775</issn><issn>0909-0495</issn><issn>1600-5775</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFkMtOAjEYRhujEUQfwI2Zje5G2-n0MktCACFEF2iMq6ZTWqjOBduZIG9vCURNXJgu2jTn_JcPgEsEbxGC7G4Os3DSjEACU0hocgS6iEIYE8bI8a93B5x5_wYhoizBp6CDaJBogrtg2I8qvYnkeu1qqVZRU0ellr51tlpGK7tcxU77umgbW1dRKZeVbqyKBnW5bsJHkIwttD8HJ0YWXl8c7h54Hg2fBvfx7HE8GfRnsSIJQbtREDGLDCvJcwWhQRQvdJ4blatUJZynRkuFcUpMwiFPWU4xzBOOeZIhiRHugZt93dD4o9W-EaX1SheFrHTdekEZ5STDLIBoDypXe--0EWtnS-m2AkGxy078yS44V4fibV7qxY9xCCsA1wdAeiUL42SlrP_hGMlCxDxwfM9tQjbb_zuL6fx10icQ7RaM96r1jf78VqV7D7thRsTLw1hkfJYSNh2JMf4CAu6UuQ</recordid><startdate>200603</startdate><enddate>200603</enddate><creator>Kawata, H.</creator><creator>Sakurai, H.</creator><creator>Shiotani, N.</creator><creator>Watanabe, Y.</creator><general>Munksgaard International Publishers</general><general>Blackwell</general><scope>BSCLL</scope><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>200603</creationdate><title>A new approach to measuring high-resolution magnetic Compton profiles</title><author>Kawata, H. ; Sakurai, H. ; Shiotani, N. ; Watanabe, Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c5251-57715fd93ca8bc00f163debbfcbc4c2884feac3345f280847b630b2838291a313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Compton scattering</topic><topic>electron momentum density</topic><topic>Exact sciences and technology</topic><topic>high-resolution measurements</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>magnetic Compton profile</topic><topic>Physics</topic><topic>X- and γ-ray instruments and techniques</topic><topic>X- and γ-ray sources, mirrors, gratings and detectors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kawata, H.</creatorcontrib><creatorcontrib>Sakurai, H.</creatorcontrib><creatorcontrib>Shiotani, N.</creatorcontrib><creatorcontrib>Watanabe, Y.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of synchrotron radiation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kawata, H.</au><au>Sakurai, H.</au><au>Shiotani, N.</au><au>Watanabe, Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A new approach to measuring high-resolution magnetic Compton profiles</atitle><jtitle>Journal of synchrotron radiation</jtitle><addtitle>J. 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subjects | Compton scattering electron momentum density Exact sciences and technology high-resolution measurements Instruments, apparatus, components and techniques common to several branches of physics and astronomy magnetic Compton profile Physics X- and γ-ray instruments and techniques X- and γ-ray sources, mirrors, gratings and detectors |
title | A new approach to measuring high-resolution magnetic Compton profiles |
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