A new approach to measuring high-resolution magnetic Compton profiles

It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method...

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Veröffentlicht in:	Journal of synchrotron radiation 2006-03, Vol.13 (2), p.221-224
Hauptverfasser:	Kawata, H., Sakurai, H., Shiotani, N., Watanabe, Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	Compton scattering electron momentum density Exact sciences and technology high-resolution measurements Instruments, apparatus, components and techniques common to several branches of physics and astronomy magnetic Compton profile Physics X- and γ-ray instruments and techniques X- and γ-ray sources, mirrors, gratings and detectors
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Beschreibung
Zusammenfassung:	It is demonstrated that long‐term stability in the polarization of incident photons delivered from an insertion device makes it possible to measure magnetic Compton profiles with a momentum resolution of 0.15 atomic units or better, without employing a solid‐state detector and the traditional method of reversing the external magnetic field or the handedness of the polarization of incident photons in an asynchronous cycle with a short period of tens to hundreds of seconds.
ISSN:	1600-5775 0909-0495 1600-5775
DOI:	10.1107/S0909049505040562