Sub-20 nm Short Channel Carbon Nanotube Transistors
Carbon nanotube field-effect transistors with sub-20 nm long channels and on/off current ratios of >106 are demonstrated. Individual single-walled carbon nanotubes with diameters ranging from 0.7 to 1.1 nm grown from structured catalytic islands using chemical vapor deposition at 700 °C form the...
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Veröffentlicht in: | Nano letters 2005-01, Vol.5 (1), p.147-150 |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Carbon nanotube field-effect transistors with sub-20 nm long channels and on/off current ratios of >106 are demonstrated. Individual single-walled carbon nanotubes with diameters ranging from 0.7 to 1.1 nm grown from structured catalytic islands using chemical vapor deposition at 700 °C form the channels. Electron beam lithography and a combination of HSQ, calix[6]arene, and PMMA e-beam resists were used to structure the short channels and source and drain regions. The nanotube transistors display on-currents in excess of 15 μA for drain-source biases of only 0.4 V. |
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ISSN: | 1530-6984 1530-6992 |
DOI: | 10.1021/nl048312d |