Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles
A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold parti...
Gespeichert in:
| Veröffentlicht in: | Nano letters 2005-03, Vol.5 (3), p.549-553 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 553 |
|---|---|
| container_issue | 3 |
| container_start_page | 549 |
| container_title | Nano letters |
| container_volume | 5 |
| creator | Zandbergen, Henny W. van Duuren, Robert J. H. A. Alkemade, Paul F. A. Lientschnig, Günther Vasquez, Oscar Dekker, Cees Tichelaar, Frans D. |
| description | A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold particle trapped between such electrodes showed the expected single-electron tunneling behavior, with a Coulomb gap corresponding to the geometry of the particle as observed with high-resolution TEM. |
| doi_str_mv | 10.1021/nl050106y |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_67538840</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>67538840</sourcerecordid><originalsourceid>FETCH-LOGICAL-a343t-1e95ceb96403a0c1a9864787dd1ad19cdd0f63b4ee233e9191e55e26a004b44e3</originalsourceid><addsrcrecordid>eNptkMFO3DAQhi1UVGDbAy9Q-VIkDgvjOPbGR1gttBKCA_QczTqT4lViL3YitOXlCd1o98LJ45nP_8gfY6cCLgRk4tI3oECA3hywY6EkTLUx2ZddXeRH7CSlFQAYqeArOxJqppQQ2TF7e7R9s-6c_8vv0QdqyHYxVJT4q-ueOfKniD61LiUXPF9sx55fE7a8DnHsOIsNR1_xWwotjff5M0a0HUX3D7uP16H-v2ONsXO2ofSNHdbYJPo-nhP252bxNP81vXu4_T2_upuizGU3FWSUpaXROUgEK9AUOp8Vs6oSWAljqwpqLZc5USYlGWEEKUWZRoB8meckJ-xsm7uO4aWn1JXDfyw1DXoKfSr1TMmiGNIn7HwL2hhSilSX6-hajJtSQPlhutyZHtgfY2i_bKnak6PaAfg5ApgGHfXg0bq057TOlAG959CmchX66AcXnyx8BwtBlAE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>67538840</pqid></control><display><type>article</type><title>Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles</title><source>MEDLINE</source><source>ACS Publications</source><creator>Zandbergen, Henny W. ; van Duuren, Robert J. H. A. ; Alkemade, Paul F. A. ; Lientschnig, Günther ; Vasquez, Oscar ; Dekker, Cees ; Tichelaar, Frans D.</creator><creatorcontrib>Zandbergen, Henny W. ; van Duuren, Robert J. H. A. ; Alkemade, Paul F. A. ; Lientschnig, Günther ; Vasquez, Oscar ; Dekker, Cees ; Tichelaar, Frans D.</creatorcontrib><description>A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold particle trapped between such electrodes showed the expected single-electron tunneling behavior, with a Coulomb gap corresponding to the geometry of the particle as observed with high-resolution TEM.</description><identifier>ISSN: 1530-6984</identifier><identifier>EISSN: 1530-6992</identifier><identifier>DOI: 10.1021/nl050106y</identifier><identifier>PMID: 15755112</identifier><language>eng</language><publisher>Washington, DC: American Chemical Society</publisher><subject>Cross-disciplinary physics: materials science; rheology ; Electric Conductivity ; Electrochemistry - instrumentation ; Electrochemistry - methods ; Electrons ; Equipment Design ; Equipment Failure Analysis ; Exact sciences and technology ; Gold - analysis ; Gold - chemistry ; Materials science ; Materials Testing - instrumentation ; Materials Testing - methods ; Microelectrodes ; Microscopy, Electron, Transmission - methods ; Nanopowders ; Nanoscale materials and structures: fabrication and characterization ; Physics ; Surface Properties</subject><ispartof>Nano letters, 2005-03, Vol.5 (3), p.549-553</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a343t-1e95ceb96403a0c1a9864787dd1ad19cdd0f63b4ee233e9191e55e26a004b44e3</citedby><cites>FETCH-LOGICAL-a343t-1e95ceb96403a0c1a9864787dd1ad19cdd0f63b4ee233e9191e55e26a004b44e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/nl050106y$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/nl050106y$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16625906$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/15755112$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Zandbergen, Henny W.</creatorcontrib><creatorcontrib>van Duuren, Robert J. H. A.</creatorcontrib><creatorcontrib>Alkemade, Paul F. A.</creatorcontrib><creatorcontrib>Lientschnig, Günther</creatorcontrib><creatorcontrib>Vasquez, Oscar</creatorcontrib><creatorcontrib>Dekker, Cees</creatorcontrib><creatorcontrib>Tichelaar, Frans D.</creatorcontrib><title>Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles</title><title>Nano letters</title><addtitle>Nano Lett</addtitle><description>A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold particle trapped between such electrodes showed the expected single-electron tunneling behavior, with a Coulomb gap corresponding to the geometry of the particle as observed with high-resolution TEM.</description><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electric Conductivity</subject><subject>Electrochemistry - instrumentation</subject><subject>Electrochemistry - methods</subject><subject>Electrons</subject><subject>Equipment Design</subject><subject>Equipment Failure Analysis</subject><subject>Exact sciences and technology</subject><subject>Gold - analysis</subject><subject>Gold - chemistry</subject><subject>Materials science</subject><subject>Materials Testing - instrumentation</subject><subject>Materials Testing - methods</subject><subject>Microelectrodes</subject><subject>Microscopy, Electron, Transmission - methods</subject><subject>Nanopowders</subject><subject>Nanoscale materials and structures: fabrication and characterization</subject><subject>Physics</subject><subject>Surface Properties</subject><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNptkMFO3DAQhi1UVGDbAy9Q-VIkDgvjOPbGR1gttBKCA_QczTqT4lViL3YitOXlCd1o98LJ45nP_8gfY6cCLgRk4tI3oECA3hywY6EkTLUx2ZddXeRH7CSlFQAYqeArOxJqppQQ2TF7e7R9s-6c_8vv0QdqyHYxVJT4q-ueOfKniD61LiUXPF9sx55fE7a8DnHsOIsNR1_xWwotjff5M0a0HUX3D7uP16H-v2ONsXO2ofSNHdbYJPo-nhP252bxNP81vXu4_T2_upuizGU3FWSUpaXROUgEK9AUOp8Vs6oSWAljqwpqLZc5USYlGWEEKUWZRoB8meckJ-xsm7uO4aWn1JXDfyw1DXoKfSr1TMmiGNIn7HwL2hhSilSX6-hajJtSQPlhutyZHtgfY2i_bKnak6PaAfg5ApgGHfXg0bq057TOlAG959CmchX66AcXnyx8BwtBlAE</recordid><startdate>20050301</startdate><enddate>20050301</enddate><creator>Zandbergen, Henny W.</creator><creator>van Duuren, Robert J. H. A.</creator><creator>Alkemade, Paul F. A.</creator><creator>Lientschnig, Günther</creator><creator>Vasquez, Oscar</creator><creator>Dekker, Cees</creator><creator>Tichelaar, Frans D.</creator><general>American Chemical Society</general><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20050301</creationdate><title>Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles</title><author>Zandbergen, Henny W. ; van Duuren, Robert J. H. A. ; Alkemade, Paul F. A. ; Lientschnig, Günther ; Vasquez, Oscar ; Dekker, Cees ; Tichelaar, Frans D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a343t-1e95ceb96403a0c1a9864787dd1ad19cdd0f63b4ee233e9191e55e26a004b44e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electric Conductivity</topic><topic>Electrochemistry - instrumentation</topic><topic>Electrochemistry - methods</topic><topic>Electrons</topic><topic>Equipment Design</topic><topic>Equipment Failure Analysis</topic><topic>Exact sciences and technology</topic><topic>Gold - analysis</topic><topic>Gold - chemistry</topic><topic>Materials science</topic><topic>Materials Testing - instrumentation</topic><topic>Materials Testing - methods</topic><topic>Microelectrodes</topic><topic>Microscopy, Electron, Transmission - methods</topic><topic>Nanopowders</topic><topic>Nanoscale materials and structures: fabrication and characterization</topic><topic>Physics</topic><topic>Surface Properties</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zandbergen, Henny W.</creatorcontrib><creatorcontrib>van Duuren, Robert J. H. A.</creatorcontrib><creatorcontrib>Alkemade, Paul F. A.</creatorcontrib><creatorcontrib>Lientschnig, Günther</creatorcontrib><creatorcontrib>Vasquez, Oscar</creatorcontrib><creatorcontrib>Dekker, Cees</creatorcontrib><creatorcontrib>Tichelaar, Frans D.</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zandbergen, Henny W.</au><au>van Duuren, Robert J. H. A.</au><au>Alkemade, Paul F. A.</au><au>Lientschnig, Günther</au><au>Vasquez, Oscar</au><au>Dekker, Cees</au><au>Tichelaar, Frans D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2005-03-01</date><risdate>2005</risdate><volume>5</volume><issue>3</issue><spage>549</spage><epage>553</epage><pages>549-553</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold particle trapped between such electrodes showed the expected single-electron tunneling behavior, with a Coulomb gap corresponding to the geometry of the particle as observed with high-resolution TEM.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><pmid>15755112</pmid><doi>10.1021/nl050106y</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1530-6984 |
| ispartof | Nano letters, 2005-03, Vol.5 (3), p.549-553 |
| issn | 1530-6984 1530-6992 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_67538840 |
| source | MEDLINE; ACS Publications |
| subjects | Cross-disciplinary physics: materials science rheology Electric Conductivity Electrochemistry - instrumentation Electrochemistry - methods Electrons Equipment Design Equipment Failure Analysis Exact sciences and technology Gold - analysis Gold - chemistry Materials science Materials Testing - instrumentation Materials Testing - methods Microelectrodes Microscopy, Electron, Transmission - methods Nanopowders Nanoscale materials and structures: fabrication and characterization Physics Surface Properties |
| title | Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T15%3A26%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sculpting%20Nanoelectrodes%20with%20a%20Transmission%20Electron%20Beam%20for%20Electrical%20and%20Geometrical%20Characterization%20of%20Nanoparticles&rft.jtitle=Nano%20letters&rft.au=Zandbergen,%20Henny%20W.&rft.date=2005-03-01&rft.volume=5&rft.issue=3&rft.spage=549&rft.epage=553&rft.pages=549-553&rft.issn=1530-6984&rft.eissn=1530-6992&rft_id=info:doi/10.1021/nl050106y&rft_dat=%3Cproquest_cross%3E67538840%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=67538840&rft_id=info:pmid/15755112&rfr_iscdi=true |