Sculpting Nanoelectrodes with a Transmission Electron Beam for Electrical and Geometrical Characterization of Nanoparticles

A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold parti...

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Veröffentlicht in:	Nano letters 2005-03, Vol.5 (3), p.549-553
Hauptverfasser:	Zandbergen, Henny W., van Duuren, Robert J. H. A., Alkemade, Paul F. A., Lientschnig, Günther, Vasquez, Oscar, Dekker, Cees, Tichelaar, Frans D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cross-disciplinary physics: materials science rheology Electric Conductivity Electrochemistry - instrumentation Electrochemistry - methods Electrons Equipment Design Equipment Failure Analysis Exact sciences and technology Gold - analysis Gold - chemistry Materials science Materials Testing - instrumentation Materials Testing - methods Microelectrodes Microscopy, Electron, Transmission - methods Nanopowders Nanoscale materials and structures: fabrication and characterization Physics Surface Properties
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Beschreibung
Zusammenfassung:	A method to produce metal electrodes with a gap of a few nanometers with a highly focused electron beam in a transmission electron microscope (TEM) is described. With this method the electrical and geometrical characterization of the same particle is possible. The I−V characteristics of a gold particle trapped between such electrodes showed the expected single-electron tunneling behavior, with a Coulomb gap corresponding to the geometry of the particle as observed with high-resolution TEM.
ISSN:	1530-6984 1530-6992
DOI:	10.1021/nl050106y