A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss ( Ω -type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial test...

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Veröffentlicht in:Ultramicroscopy 2005-04, Vol.103 (1), p.7-15
Hauptverfasser: Hutchison, John L., Titchmarsh, John M., Cockayne, David J.H., Doole, Ron C., Hetherington, Crispin J.D., Kirkland, Angus I., Sawada, H.
Format: Artikel
Sprache:eng
Schlagworte:
Aberration correction
HREM
Omega filter
STEM
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Beschreibung
Zusammenfassung:A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss ( Ω -type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of ∼0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2004.11.010