Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe...

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Veröffentlicht in:	Journal of the American Chemical Society 2005-03, Vol.127 (10), p.3272-3273
Hauptverfasser:	van der Eerden, Ad M. J, Visser, Tom, Nijhuis, T. Alexander, Ikeda, Yasuo, Lepage, Muriel, Koningsberger, Diek C, Weckhuysen, Bert M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic transport in condensed matter Exact sciences and technology Other topics in electronic transport in condensed matter Physics
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe molecule is required and that real-time measurements under reaction conditions are possible.
ISSN:	0002-7863 1520-5126
DOI:	10.1021/ja043107l