Calculating the exclusion probability and paternity index for X-chromosomal loci in the presence of substructure

There has been recent interest in the use of X-chromosomal loci for forensic and relatedness testing casework, with many authors developing new X-linked short tandem repeat (STR) loci suitable for forensic use. Here we present formulae for two key quantities in paternity testing, the average probabi...

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Veröffentlicht in:Forensic science international 2005-05, Vol.149 (2), p.201-203
Hauptverfasser: Ayres, Karen L., Powley, William M.
Format: Artikel
Sprache:eng
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Zusammenfassung:There has been recent interest in the use of X-chromosomal loci for forensic and relatedness testing casework, with many authors developing new X-linked short tandem repeat (STR) loci suitable for forensic use. Here we present formulae for two key quantities in paternity testing, the average probability of exclusion and the paternity index, which are suitable for X-chromosomal loci in the presence of population substructure.
ISSN:0379-0738
1872-6283
DOI:10.1016/j.forsciint.2004.06.017