Photoelectron spectroscopy of chromium-doped silicon cluster anions
The photoelectron spectra of chromium-doped silicon cluster anions, CrSi-(n), were measured over the size range, n=8-12. Their vertical detachment energies were measured to be 2.71, 2.88, 2.87, 2.95, and 3.18 eV, respectively. Our results support theoretical calculations by Khanna, Rao, and Jena [Ph...
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Veröffentlicht in: | The Journal of chemical physics 2005-02, Vol.122 (7), p.071101-071101 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The photoelectron spectra of chromium-doped silicon cluster anions, CrSi-(n), were measured over the size range, n=8-12. Their vertical detachment energies were measured to be 2.71, 2.88, 2.87, 2.95, and 3.18 eV, respectively. Our results support theoretical calculations by Khanna, Rao, and Jena [Phys. Rev. Lett. 89, 016803 (2002)] which found CrSi12 to be an enhanced stability (magic) cluster with its chromium atom encapsulated inside a silicon cage and with its magnetic moment completely quenched by the effects of the surrounding cage. |
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ISSN: | 0021-9606 1089-7690 |
DOI: | 10.1063/1.1851984 |