Driving force and mechanism for spontaneous metal whisker formation
The room temperature spontaneous growth of low melting point metal whiskers, such as Sn, poses a serious reliability problem in the semiconducting industry; a problem that has become acute with the introduction of Pb-free technology. To date, this 50+ year old problem has resisted interpretation. He...
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Veröffentlicht in: | Physical review letters 2004-11, Vol.93 (20), p.206104.1-206104.4, Article 206104 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The room temperature spontaneous growth of low melting point metal whiskers, such as Sn, poses a serious reliability problem in the semiconducting industry; a problem that has become acute with the introduction of Pb-free technology. To date, this 50+ year old problem has resisted interpretation. Herein we show that the driving force is essentially a reaction between oxygen and the sprouting metal. The resulting volume expansion creates a compressive stress that pushes the whiskers up. The model proposed explains our observations on In and Sn whiskers and many past observations. The solution is in principle simple: diffusion of oxygen into the metal must be prevented or slowed down. This was demonstrated by coating the active surfaces with a polymer coating. |
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ISSN: | 0031-9007 1079-7114 |
DOI: | 10.1103/physrevlett.93.206104 |