Electron Capture and Transfer Dissociation: Peptide Structure Analysis at Different Ion Internal Energy Levels
We decoupled electron-transfer dissociation (ETD) and collision-induced dissociation of charge-reduced species (CRCID) events to probe the lifetimes of intermediate radical species in ETD-based ion trap tandem mass spectrometry of peptides. Short-lived intermediates formed upon electron transfer req...
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Veröffentlicht in: | Journal of the American Society for Mass Spectrometry 2009-04, Vol.20 (4), p.567-575 |
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Sprache: | eng |
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Zusammenfassung: | We decoupled electron-transfer dissociation (ETD) and collision-induced dissociation of charge-reduced species (CRCID) events to probe the lifetimes of intermediate radical species in ETD-based ion trap tandem mass spectrometry of peptides. Short-lived intermediates formed upon electron transfer require less energy for product ion formation and appear in regular ETD mass spectra, whereas long-lived intermediates require additional vibrational energy and yield product ions as a function of CRCID amplitude. The observed dependencies complement the results obtained by double-resonance electron-capture dissociation (ECD) Fourier transform ion cyclotron resonance mass spectrometry (FT-ICR MS) and ECD in a cryogenic ICR trap. Compared with ECD FT-ICR MS, ion trap MS offers lower precursor ion internal energy conditions, leading to more abundant charge-reduced radical intermediates and larger variation of product ion abundance as a function of vibrational post-activation amplitude. In many cases decoupled CRCID after ETD exhibits abundant radical
c-type and even-electron
z-type ions, in striking contrast to predominantly even-electron
c-type and radical
z-type ions in ECD FT-ICR MS and especially activated ion-ECD, thus providing a new insight into the fundamentals of ECD/ETD.
Radical and even-electron product ion yield in ion trap-based ETD differs from ECD FT-ICR MS. ETD and CRCID distinguish short and long-lifetime radical intermediate complexes. |
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ISSN: | 1044-0305 1879-1123 |
DOI: | 10.1016/j.jasms.2008.11.016 |