Hierarchical Generalized Linear Models for the Analysis of Judge Ratings

It is known that the Rasch model is a special two-level hierarchical generalized linear model (HGLM). This article demonstrates that the many-faceted Rasch model (MFRM) is also a special case of the two-level HGLM, with a random intercept representing examinee ability on a test, and fixed effects fo...

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Veröffentlicht in:Journal of educational measurement 2009-06, Vol.46 (2), p.198-219
Hauptverfasser: Muckle, Timothy J., Karabatsos, George
Format: Artikel
Sprache:eng
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Zusammenfassung:It is known that the Rasch model is a special two-level hierarchical generalized linear model (HGLM). This article demonstrates that the many-faceted Rasch model (MFRM) is also a special case of the two-level HGLM, with a random intercept representing examinee ability on a test, and fixed effects for the test items, judges, and possibly other facets. This perspective suggests useful modeling extensions of the MFRM. For example, in the HGLM framework it is possible to model random effects for items and judges in order to assess their stability across examinees. The MFRM can also be extended so that item difficulty and judge severity are modeled as functions of examinee characteristics (covariates), for the purposes of detecting differential item functioning and differential rater functioning. Practical illustrations of the HGLM are presented through the analysis of simulated and real judge-mediated data sets involving ordinal responses.
ISSN:0022-0655
1745-3984
DOI:10.1111/j.1745-3984.2009.00078.x