Metrological support to parameter measurement for nanoparticles in technological media

Methods are considered for measuring the parameters of nanoparticles in natural and technological media as used in the nanoindustry. Exact monitoring is required for the parameters of the medium where the nanoparticles are suspended in order to obtain reliable measurement data. Measurement methods a...

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Veröffentlicht in:	Measurement techniques 2009-05, Vol.52 (5), p.449-458
Hauptverfasser:	Krasovskii, P. A., Karpov, O. V., Balakhanov, D. M., Lesnikov, E. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical Chemistry Brownian motion Characterization and Evaluation of Materials Lasers Measurement Science and Instrumentation Measurement techniques Microscopy Nanometrology Nanoparticles Particle size Physical Chemistry Physics Physics and Astronomy Radiation Studies X-rays
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Beschreibung
Zusammenfassung:	Methods are considered for measuring the parameters of nanoparticles in natural and technological media as used in the nanoindustry. Exact monitoring is required for the parameters of the medium where the nanoparticles are suspended in order to obtain reliable measurement data. Measurement methods are examined for the nanoparticle size range 5–100 nm for aqueous and gaseous media in order to set up a metrological suite for measuring the parameters of nanoparticles in these media.
ISSN:	0543-1972 1573-8906
DOI:	10.1007/s11018-009-9307-2