Interconnection effects on the performance of basic subcircuits with single-electron tunneling devices

Interconnection limits seem to be a potential problem to the evolution of the semiconductor industry, especially in the nanoscale. In this work, the electrical performance of basic cells is studied with the help of a simple interconnection model, whose parameters can be changed. Our goal, with this...

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Veröffentlicht in:	Applied surface science 2008-11, Vol.255 (3), p.715-717
Hauptverfasser:	Carneiro, V.G.A., Guimarães, J.G., da Costa, J.C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Carbon nanotube Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronics Exact sciences and technology Interconnection Metallization, contacts, interconnects device isolation Microelectronic fabrication (materials and surfaces technology) Nanoelectronics Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Single-electron transistor Surface and interface electron states Winner-take-all
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