Thin film engineering for N@C60 quantum computers : Spin detection and device patterning approaches

Using pulsed electrically detected magnetic resonance (p-EDMR), we measured the coherent spin evolution of about 10,000 paramagnetic states in C60 fullerene thin films, opening a way to study potentially single-qubit read-out mechanisms of N@C60 molecules. The N@C60 compatible, low-temperature metho...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Solid state sciences 2008-10, Vol.10 (10), p.1314-1321
Hauptverfasser: SCHAEFER, Sebastian, HUEBENER, Kati, HARNEIT, Wolfgang, BOEHME, Christoph, FOSTIROPOULOS, Konstantinos, ANGERMANN, Heike, RAPPICH, Jörg, BEHRENDS, Jan, LIPS, Klaus
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Using pulsed electrically detected magnetic resonance (p-EDMR), we measured the coherent spin evolution of about 10,000 paramagnetic states in C60 fullerene thin films, opening a way to study potentially single-qubit read-out mechanisms of N@C60 molecules. The N@C60 compatible, low-temperature method of spray-deposition of fullerenes on silicon substrates pre-patterned by local anodic oxidation is shown to yield fullerene structures on the 10 nm scale, still somewhat too coarse for quantum register structures, but suitable for further steps in the application of the p-EDMR method to N@C60.
ISSN:1293-2558
1873-3085
DOI:10.1016/j.solidstatesciences.2007.12.039