Application of Cadmium Telluride Detector to High-Energy X-Ray Computed Tomography for Industrial Use

A high sensitivity x-ray sensor has been developed for high energy industry Computed Tomography (CT) systems. By using a Cadmium Telluride (CdTe) semiconductor, the detection sensitivity was improved by about two times compared with a conventional Si sensor. Consequently, the statistics noise contained in the CT image was reduced favorably (by about 25%). The sensor was successfully used in the high energy industry CT system with an electron linear accelerator (LINAC), and the quality of the CT images increased. The CT system, equipped with the sensor, is considered to be suitable to use for the high density and thick objects.