Investigation of grain boundaries influence on dielectric properties in fine-grained BaTiO3 ceramics without the core-shell structure

Grain boundaries of the Ca-doped and fine-grained BaTiO3 (BT) ceramics were investigated to understand the role of grain boundaries, using HRTEM, XRD and chemical etching analyses. Electrical properties and complex impedance spectroscopy of multilayer ceramic capacitors using Ca-doped BT were also e...

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Veröffentlicht in:Ceramics international 2008-05, Vol.34 (4), p.933-937
Hauptverfasser: WADA, Nobuyuki, HIRAMATSU, Takashi, TAMURA, Toshiyuki, SAKABE, Yukio
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Sprache:eng
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Zusammenfassung:Grain boundaries of the Ca-doped and fine-grained BaTiO3 (BT) ceramics were investigated to understand the role of grain boundaries, using HRTEM, XRD and chemical etching analyses. Electrical properties and complex impedance spectroscopy of multilayer ceramic capacitors using Ca-doped BT were also examined to investigate the roles of grain boundaries. Doped elements were peculiarly enriched at the grain boundaries and tetragonality of the BT ceramics recovered significantly after grain boundaries were etched. The grain boundaries have a significant influence in stabilising the temperature dependence of the dielectric properties, and the residual stress is caused by grain boundaries with the grain growth inhibited during sintering. The high reliability of BT ceramics without the core-shell structure is considered to be due to the high resistivity of the grain boundaries. 19 refs.
ISSN:0272-8842
1873-3956
DOI:10.1016/j.ceramint.2007.09.061