Structure, surface morphological and opto-electronic properties of zinc sulphide thin films deposited by dip method

ZnS thin films have been deposited by dip technique using succinic acid as a complexing agent. The structural and morphological characterizations of films have been investigated by X-ray diffraction, scanning electron microscope. X-ray pattern shows crystalline has hexagonal structure. The films sho...

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Veröffentlicht in:	Applied surface science 2009-10, Vol.256 (1), p.81-84
Hauptverfasser:	Hankare, P.P., Chate, P.A., Sathe, D.J., Patil, A.A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Dip technique Exact sciences and technology Growth mechanism Physics Surface morphology X-ray diffraction
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Beschreibung
Zusammenfassung:	ZnS thin films have been deposited by dip technique using succinic acid as a complexing agent. The structural and morphological characterizations of films have been investigated by X-ray diffraction, scanning electron microscope. X-ray pattern shows crystalline has hexagonal structure. The films show that good optical properties high absorption and band gap value was found to be 3.7 eV. The specific conductivity of the film was found to be in order of 10 −5 (Ω cm) −1 and showing n-type conduction.
ISSN:	0169-4332 1873-5584
DOI:	10.1016/j.apsusc.2009.07.068