Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors

In this paper, we propose a diagnose strategy based on built-in current sensors able to detect the effects of single event transients (SETs) in SRAM memory decoders. By analyzing the effects, it is possible to mitigate the error by warning the system about the erroneous write and read operation or b...

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Veröffentlicht in:Journal of electronic testing 2008-10, Vol.24 (5), p.425-437
Hauptverfasser: Henes Neto, Egas, Wirth, Gilson, Kastensmidt, Fernanda Lima
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Sprache:eng
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