Anomalous large internal friction observed for nm-thick Ag film below room temperature
The internal friction of a nm-thick Ag film deposited on a Si substrate was studied. In a sputter deposited (SD-) Ag film on wet-oxidized high-boron CZ-Si (WO-Si BCZ), pre-exposure of air(wet) brings about the 200–250 K twin peaks, and the warming up to 300 K in a vacuum causes disappearance of the...
Gespeichert in:
Veröffentlicht in: | Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2009-09, Vol.521, p.291-294 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The internal friction of a nm-thick Ag film deposited on a Si substrate was studied. In a sputter deposited (SD-) Ag film on wet-oxidized high-boron CZ-Si (WO-Si
BCZ), pre-exposure of air(wet) brings about the 200–250
K twin peaks, and the warming up to 300
K in a vacuum causes disappearance of the twin peaks. The peak height of the 200–250
K twin peaks shows the maximum at the SD-Ag film thickness of about 80
nm. No or very low peaks are observed in all the SD-Ag films on hydrogen terminated (HT-) or thermally-oxidized Si substrates. The interface region between SD-Ag and WO-Si
BCZ containing OH molecules is responsible for the 200–250
K twin peaks. The underlying mechanism of the peaks is not known at present. |
---|---|
ISSN: | 0921-5093 1873-4936 |
DOI: | 10.1016/j.msea.2008.09.141 |