Anomalous large internal friction observed for nm-thick Ag film below room temperature

The internal friction of a nm-thick Ag film deposited on a Si substrate was studied. In a sputter deposited (SD-) Ag film on wet-oxidized high-boron CZ-Si (WO-Si BCZ), pre-exposure of air(wet) brings about the 200–250 K twin peaks, and the warming up to 300 K in a vacuum causes disappearance of the...

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Veröffentlicht in:Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2009-09, Vol.521, p.291-294
Hauptverfasser: Tanimoto, H., Fujiwara, A., Yamaura, K., Mizubayashi, H.
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Sprache:eng
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Zusammenfassung:The internal friction of a nm-thick Ag film deposited on a Si substrate was studied. In a sputter deposited (SD-) Ag film on wet-oxidized high-boron CZ-Si (WO-Si BCZ), pre-exposure of air(wet) brings about the 200–250 K twin peaks, and the warming up to 300 K in a vacuum causes disappearance of the twin peaks. The peak height of the 200–250 K twin peaks shows the maximum at the SD-Ag film thickness of about 80 nm. No or very low peaks are observed in all the SD-Ag films on hydrogen terminated (HT-) or thermally-oxidized Si substrates. The interface region between SD-Ag and WO-Si BCZ containing OH molecules is responsible for the 200–250 K twin peaks. The underlying mechanism of the peaks is not known at present.
ISSN:0921-5093
1873-4936
DOI:10.1016/j.msea.2008.09.141