Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique

Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique

A new application of the KOSSEL and the XRT (X‐ray Rotation‐Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third...

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Veröffentlicht in:Crystal research and technology (1979) 2004-07, Vol.39 (7), p.623-633
Hauptverfasser: Bauch, J., Wege, St, Böhling, M., Ullrich, H.-J.
Format: Artikel
Sprache:eng
Schlagworte:
determination of lattice parameters
determination of residual stress
KOSSEL technique
strain
X-ray microdiffraction
XRT technique
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Zusammenfassung:A new application of the KOSSEL and the XRT (X‐ray Rotation‐Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third kind can be determined. Some further evaluation procedures are described. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:0232-1300
1521-4079
DOI:10.1002/crat.200310234