Ultrasonic sensor system for CaF2 interface monitoring with rods permanently embedded in crystal

The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used...

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Veröffentlicht in:Crystal research and technology (1979) 2005-08, Vol.40 (8), p.761-764
Hauptverfasser: Royer Jr, R. L., Rose, J. L.
Format: Artikel
Sprache:eng
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Zusammenfassung:The interface position of a CaF2 crystal was successfully monitored during growth using an innovative ultrasonic sensor system. The sensor system utilizes a top entry approach consisting of probe rods permanently positioned at the bottom of the crucible. Ultrasonic time of flight data (TOF) is used to determine interface position. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
ISSN:0232-1300
1521-4079
DOI:10.1002/crat.200410426