LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance
Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as p...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2007-12, Vol.54 (6), p.2450-2456 |
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| container_end_page | 2456 |
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| container_issue | 6 |
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| container_title | IEEE transactions on nuclear science |
| container_volume | 54 |
| creator | Johnston, A.H. Miyahira, T.F. |
| description | Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance. |
| doi_str_mv | 10.1109/TNS.2007.909910 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_34507242</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4395043</ieee_id><sourcerecordid>34507242</sourcerecordid><originalsourceid>FETCH-LOGICAL-c351t-775c9c93330ee0b82b87673b5797d956c0b76bb55662d58598172dff9ac3206d3</originalsourceid><addsrcrecordid>eNp9kT1PwzAQhi0EEqUwM7BEDDClPdtxbLOh0tJKER0os-U4DrRK42AnA_8eV0UMDEynOz3vfb0IXWOYYAxyunl5nRAAPpEgJYYTNMKMiRQzLk7RCACLVGZSnqOLEHYxzRiwESqK-VOyseajdY1739qQ1M4n6653xg1dY314SBZDW-m9bXvdJKsQhgjptkqW2letDSF5jDWvW2Mv0Vmtm2CvfuIYvS3mm9kyLdbPq9ljkRrKcJ9yzow0klIK1kIpSCl4zmnJuOSVZLmBkudlyViek4oJJgXmpKprqQ0lkFd0jO6PfTvvPuM6vdpvg7FNo1vrhqCEgJxxkDySd_-SNH6Bk4xE8PYPuHODb-MVSmIS5xOcRWh6hIx3IXhbq85v99p_KQzqYIKKJqiDCepoQlTcHBVba-0vnVHJIKP0GyxxgM0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912172214</pqid></control><display><type>article</type><title>LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance</title><source>IEEE Electronic Library (IEL)</source><creator>Johnston, A.H. ; Miyahira, T.F.</creator><creatorcontrib>Johnston, A.H. ; Miyahira, T.F.</creatorcontrib><description>Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2007.909910</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Absorption ; Assurance ; Degradation ; Devices ; Diodes ; Hardness ; Hardness assurance ; Light emitting diodes ; light-emitting diode ; Manufacturing ; optocoupler ; Photodetectors ; Propulsion ; Radiation damage ; Radiation detectors ; radiation effects ; Recovery time ; Silicon ; Space technology ; Testing ; Wavelengths</subject><ispartof>IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2450-2456</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c351t-775c9c93330ee0b82b87673b5797d956c0b76bb55662d58598172dff9ac3206d3</citedby><cites>FETCH-LOGICAL-c351t-775c9c93330ee0b82b87673b5797d956c0b76bb55662d58598172dff9ac3206d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4395043$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4395043$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Johnston, A.H.</creatorcontrib><creatorcontrib>Miyahira, T.F.</creatorcontrib><title>LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.</description><subject>Absorption</subject><subject>Assurance</subject><subject>Degradation</subject><subject>Devices</subject><subject>Diodes</subject><subject>Hardness</subject><subject>Hardness assurance</subject><subject>Light emitting diodes</subject><subject>light-emitting diode</subject><subject>Manufacturing</subject><subject>optocoupler</subject><subject>Photodetectors</subject><subject>Propulsion</subject><subject>Radiation damage</subject><subject>Radiation detectors</subject><subject>radiation effects</subject><subject>Recovery time</subject><subject>Silicon</subject><subject>Space technology</subject><subject>Testing</subject><subject>Wavelengths</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kT1PwzAQhi0EEqUwM7BEDDClPdtxbLOh0tJKER0os-U4DrRK42AnA_8eV0UMDEynOz3vfb0IXWOYYAxyunl5nRAAPpEgJYYTNMKMiRQzLk7RCACLVGZSnqOLEHYxzRiwESqK-VOyseajdY1739qQ1M4n6653xg1dY314SBZDW-m9bXvdJKsQhgjptkqW2letDSF5jDWvW2Mv0Vmtm2CvfuIYvS3mm9kyLdbPq9ljkRrKcJ9yzow0klIK1kIpSCl4zmnJuOSVZLmBkudlyViek4oJJgXmpKprqQ0lkFd0jO6PfTvvPuM6vdpvg7FNo1vrhqCEgJxxkDySd_-SNH6Bk4xE8PYPuHODb-MVSmIS5xOcRWh6hIx3IXhbq85v99p_KQzqYIKKJqiDCepoQlTcHBVba-0vnVHJIKP0GyxxgM0</recordid><startdate>20071201</startdate><enddate>20071201</enddate><creator>Johnston, A.H.</creator><creator>Miyahira, T.F.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>20071201</creationdate><title>LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance</title><author>Johnston, A.H. ; Miyahira, T.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c351t-775c9c93330ee0b82b87673b5797d956c0b76bb55662d58598172dff9ac3206d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Absorption</topic><topic>Assurance</topic><topic>Degradation</topic><topic>Devices</topic><topic>Diodes</topic><topic>Hardness</topic><topic>Hardness assurance</topic><topic>Light emitting diodes</topic><topic>light-emitting diode</topic><topic>Manufacturing</topic><topic>optocoupler</topic><topic>Photodetectors</topic><topic>Propulsion</topic><topic>Radiation damage</topic><topic>Radiation detectors</topic><topic>radiation effects</topic><topic>Recovery time</topic><topic>Silicon</topic><topic>Space technology</topic><topic>Testing</topic><topic>Wavelengths</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Johnston, A.H.</creatorcontrib><creatorcontrib>Miyahira, T.F.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Johnston, A.H.</au><au>Miyahira, T.F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2007-12-01</date><risdate>2007</risdate><volume>54</volume><issue>6</issue><spage>2450</spage><epage>2456</epage><pages>2450-2456</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2007.909910</doi><tpages>7</tpages></addata></record> |
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| identifier | ISSN: 0018-9499 |
| ispartof | IEEE transactions on nuclear science, 2007-12, Vol.54 (6), p.2450-2456 |
| issn | 0018-9499 1558-1578 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Absorption Assurance Degradation Devices Diodes Hardness Hardness assurance Light emitting diodes light-emitting diode Manufacturing optocoupler Photodetectors Propulsion Radiation damage Radiation detectors radiation effects Recovery time Silicon Space technology Testing Wavelengths |
| title | LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T01%3A04%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=LED%20Technologies%20for%20Optocouplers:%20Fundamental%20Issues%20and%20Hardness%20Assurance&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Johnston,%20A.H.&rft.date=2007-12-01&rft.volume=54&rft.issue=6&rft.spage=2450&rft.epage=2456&rft.pages=2450-2456&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2007.909910&rft_dat=%3Cproquest_RIE%3E34507242%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912172214&rft_id=info:pmid/&rft_ieee_id=4395043&rfr_iscdi=true |