LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance

LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance

Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as p...

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Veröffentlicht in:IEEE transactions on nuclear science 2007-12, Vol.54 (6), p.2450-2456
Hauptverfasser: Johnston, A.H., Miyahira, T.F.
Format: Artikel
Sprache:eng
Schlagworte:
Absorption
Assurance
Degradation
Devices
Diodes
Hardness
Hardness assurance
Light emitting diodes
light-emitting diode
Manufacturing
optocoupler
Photodetectors
Propulsion
Radiation damage
Radiation detectors
radiation effects
Recovery time
Silicon
Space technology
Testing
Wavelengths
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Beschreibung
Zusammenfassung:Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2007.909910