Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology
This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the da...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2008-12, Vol.55 (6), p.3375-3380 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Wissel, L. Cannon, E.H. Heidel, D.F. Gordon, M.S. Rodbell, K.P. |
| description | This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions. |
| doi_str_mv | 10.1109/TNS.2008.2007299 |
| format | Article |
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| identifier | ISSN: 0018-9499 |
| ispartof | IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3375-3380 |
| issn | 0018-9499 1558-1578 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Acceleration Carbon Clocks Flip-flop Flip-flops Foils Inverters Mathematical models Neutrons Packaging Paper technology Predictive models Protons Single event upset single-event upset (SEU) soft error Spallation Thorium |
| title | Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology |
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