Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology

Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk Technology

This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the da...

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Veröffentlicht in:IEEE transactions on nuclear science 2008-12, Vol.55 (6), p.3375-3380
Hauptverfasser: Wissel, L., Cannon, E.H., Heidel, D.F., Gordon, M.S., Rodbell, K.P.
Format: Artikel
Sprache:eng
Schlagworte:
Acceleration
Carbon
Clocks
Flip-flop
Flip-flops
Foils
Inverters
Mathematical models
Neutrons
Packaging
Paper technology
Predictive models
Protons
Single event upset
single-event upset (SEU)
soft error
Spallation
Thorium
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Beschreibung
Zusammenfassung:This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2008.2007299