Modeling of Programming and Read Performance in Phase-Change Memories-Part I: Cell Optimization and Scaling

One of the major concerns for the feasibility of phase-change memories is the reduction of the programming current. To this aim, several efforts have been dedicated both on cell geometry and on material engineering. This paper addresses programming-current minimization by the optimization of the cel...

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Veröffentlicht in:IEEE transactions on electron devices 2008-02, Vol.55 (2), p.506-514
Hauptverfasser: Russo, U., Ielmini, D., Redaelli, A., Lacaita, A.L.
Format: Artikel
Sprache:eng
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Zusammenfassung:One of the major concerns for the feasibility of phase-change memories is the reduction of the programming current. To this aim, several efforts have been dedicated both on cell geometry and on material engineering. This paper addresses programming-current minimization by the optimization of the cell geometry and materials, programming-current scaling, and the tradeoff between programming and readout performances of the cell. A general procedure to find the optimum-cell geometry is proposed and applied to a prototype vertical cell. Then, the evolution of program and read performances through technology nodes is analyzed by numerical simulations with the aid of an analytical model, for both the isotropic- and nonisotropic-scaling approaches. The two scaling approaches are discussed and compared in terms of program and read cell performances. Finally, material optimization is considered for further program-read improvement.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2007.911630