The Methods for RTS Noise Identification

The Methods for RTS Noise Identification

In the paper authors present two methods, which allows to identify the RTS noise in noise signal of semiconductor devices. The first one was elaborated to identify the RTS noise and also to estimate the number of its levels. The second one can be used to estimate all of the parameters of Gaussian an...

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Hauptverfasser: Konczakowska, Alicja, Stawarz-Graczyk, Barbara
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:In the paper authors present two methods, which allows to identify the RTS noise in noise signal of semiconductor devices. The first one was elaborated to identify the RTS noise and also to estimate the number of its levels. The second one can be used to estimate all of the parameters of Gaussian and non-Gaussian components in the noise signal in a frequency domain.
ISSN:0094-243X
DOI:10.1063/1.3140473