Possible Correlation between Flicker Noise and Bias Temperature Stress

A link between Bias Temperature Stress (BTS, NBTI) and flicker noise (1/f-noise) is explored by comparing flicker noise data to charge pumping data. Large-area devices are shown to initially have very low, bias independent normalized flicker noise. After BTS the normalized noise increases considerably and becomes gate bias dependent. Small-area devices are shown to exhibit bias dependent burst noise (RTS) in addition to flicker noise, regardless of BTS.