Analysis of temperature dependent I – V measurements on Pd/ZnO Schottky barrier diodes and the determination of the Richardson constant
Temperature dependent current–voltage ( I – V ) and Hall measurements were performed on Pd/ZnO Schottky barrier diodes in the range 20–300 K. The apparent Richardson constant was found to be 8.60 × 10 - 9 A K - 2 cm - 2 in the 60–160 K temperature range, and mean barrier height of 0.50 eV in the 180...
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Veröffentlicht in: | Physica. B, Condensed matter Condensed matter, 2009-05, Vol.404 (8), p.1092-1096 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
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Zusammenfassung: | Temperature dependent current–voltage
(
I
–
V
)
and Hall measurements were performed on Pd/ZnO Schottky barrier diodes in the range 20–300
K. The apparent Richardson constant was found to be
8.60
×
10
-
9
A
K
-
2
cm
-
2
in the 60–160
K temperature range, and mean barrier height of 0.50
eV in the 180–300
K temperature range. After barrier height inhomogeneities correction, the Richardson constant and the mean barrier height were obtained as
167
A
K
-
2
cm
-
2
and 0.61
eV in the temperature range 80–180
K, respectively. A defect level with energy at 0.12
eV below the conduction band was observed using the saturation current plot and
(
0.11
±
0.01
)
eV
using deep level transient spectroscopy measurements. |
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ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/j.physb.2008.11.022 |