XPS survey spectra simulation of nano-structured surfaces

We have developed a software tool for the generation of survey spectra in X‐ray photoelectron spectroscopy (GOSSIP) to simulate wide spectra in the range 200–1500 eV from nano‐structured surfaces. It is based on linear combination of delta layers spectra with the atomic spectra of the elements or co...

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Bibliographische Detailangaben
Veröffentlicht in:	Surface and interface analysis 2009-04, Vol.41 (4), p.295-302
Hauptverfasser:	Ollivier, E., Langeron, J. P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemical composition analysis, chemical depth and dopant profiling Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology GOSSIP inelastic background Materials science Materials testing nano-structured surface Photoemission and photoelectron spectra Physics QUASES spectrum simulation XPS
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