Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process...

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Veröffentlicht in:Scripta materialia 2009-05, Vol.60 (9), p.799-802
Hauptverfasser: Won, Jonghan, Valdez, James A., Naito, Muneyuki, Ishimaru, Manabu, Sickafus, Kurt E.
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container_issue 9
container_start_page 799
container_title Scripta materialia
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creator Won, Jonghan
Valdez, James A.
Naito, Muneyuki
Ishimaru, Manabu
Sickafus, Kurt E.
description Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation.
doi_str_mv 10.1016/j.scriptamat.2009.01.023
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_33943445</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S1359646209000517</els_id><sourcerecordid>33943445</sourcerecordid><originalsourceid>FETCH-LOGICAL-c432t-9c6805ac037a03b1ea8ac3969730d809b2146cdc68db4c7f0b3608ba52667aeb3</originalsourceid><addsrcrecordid>eNqFkUtLxDAUhYsoOI7-h67ETevNo2m71MEXDLgZ1yGvYsq0qUkqzL83ZYTZ6epeyHcOuedkWY6gRIDYfV8G5e0UxSBiiQHaElAJmJxlK9TUuGhoxc7TTqq2YJThy-wqhB4AGMJolfU7L8Yw2BCsG3OzNyr6tAxWeReUmw55iLM-5K7Lxem9kEYMhR31rIzOp08RTB4Xo8759I_FKglG66SdhzSjt9pcZxed2Adz8zvX2cfz027zWmzfX942D9tCUYJj0SrWQCUUkFoAkciIRijSsrYmoBtoJUaUKZ0oLamqO5CEQSNFhRmrhZFknd0efSfvvmYTIk_nKbPfi9G4OXBCWkoorRJ49yeIoMEYEMWQ0OaILrEEbzo-eTsIf0gQX3rgPT_1wJceOCCeekjSx6PUpJu_rfEJtGZMwVmf0uTa2f9NfgBIYpkB</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1082201420</pqid></control><display><type>article</type><title>Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride</title><source>Access via ScienceDirect (Elsevier)</source><creator>Won, Jonghan ; Valdez, James A. ; Naito, Muneyuki ; Ishimaru, Manabu ; Sickafus, Kurt E.</creator><creatorcontrib>Won, Jonghan ; Valdez, James A. ; Naito, Muneyuki ; Ishimaru, Manabu ; Sickafus, Kurt E.</creatorcontrib><description>Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation.</description><identifier>ISSN: 1359-6462</identifier><identifier>EISSN: 1872-8456</identifier><identifier>DOI: 10.1016/j.scriptamat.2009.01.023</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><subject>Displacement ; Electron irradiation ; Electron microscopy ; Fluence ; Niobium nitride ; Nitrogen atoms ; Order–disorder ; Phase transformation ; Superlattice structures ; Transformations ; Transmission electron microscopy ; Vacancies</subject><ispartof>Scripta materialia, 2009-05, Vol.60 (9), p.799-802</ispartof><rights>2009</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c432t-9c6805ac037a03b1ea8ac3969730d809b2146cdc68db4c7f0b3608ba52667aeb3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.scriptamat.2009.01.023$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27929,27930,46000</link.rule.ids></links><search><creatorcontrib>Won, Jonghan</creatorcontrib><creatorcontrib>Valdez, James A.</creatorcontrib><creatorcontrib>Naito, Muneyuki</creatorcontrib><creatorcontrib>Ishimaru, Manabu</creatorcontrib><creatorcontrib>Sickafus, Kurt E.</creatorcontrib><title>Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride</title><title>Scripta materialia</title><description>Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation.</description><subject>Displacement</subject><subject>Electron irradiation</subject><subject>Electron microscopy</subject><subject>Fluence</subject><subject>Niobium nitride</subject><subject>Nitrogen atoms</subject><subject>Order–disorder</subject><subject>Phase transformation</subject><subject>Superlattice structures</subject><subject>Transformations</subject><subject>Transmission electron microscopy</subject><subject>Vacancies</subject><issn>1359-6462</issn><issn>1872-8456</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqFkUtLxDAUhYsoOI7-h67ETevNo2m71MEXDLgZ1yGvYsq0qUkqzL83ZYTZ6epeyHcOuedkWY6gRIDYfV8G5e0UxSBiiQHaElAJmJxlK9TUuGhoxc7TTqq2YJThy-wqhB4AGMJolfU7L8Yw2BCsG3OzNyr6tAxWeReUmw55iLM-5K7Lxem9kEYMhR31rIzOp08RTB4Xo8759I_FKglG66SdhzSjt9pcZxed2Adz8zvX2cfz027zWmzfX942D9tCUYJj0SrWQCUUkFoAkciIRijSsrYmoBtoJUaUKZ0oLamqO5CEQSNFhRmrhZFknd0efSfvvmYTIk_nKbPfi9G4OXBCWkoorRJ49yeIoMEYEMWQ0OaILrEEbzo-eTsIf0gQX3rgPT_1wJceOCCeekjSx6PUpJu_rfEJtGZMwVmf0uTa2f9NfgBIYpkB</recordid><startdate>20090501</startdate><enddate>20090501</enddate><creator>Won, Jonghan</creator><creator>Valdez, James A.</creator><creator>Naito, Muneyuki</creator><creator>Ishimaru, Manabu</creator><creator>Sickafus, Kurt E.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>8BQ</scope></search><sort><creationdate>20090501</creationdate><title>Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride</title><author>Won, Jonghan ; Valdez, James A. ; Naito, Muneyuki ; Ishimaru, Manabu ; Sickafus, Kurt E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c432t-9c6805ac037a03b1ea8ac3969730d809b2146cdc68db4c7f0b3608ba52667aeb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Displacement</topic><topic>Electron irradiation</topic><topic>Electron microscopy</topic><topic>Fluence</topic><topic>Niobium nitride</topic><topic>Nitrogen atoms</topic><topic>Order–disorder</topic><topic>Phase transformation</topic><topic>Superlattice structures</topic><topic>Transformations</topic><topic>Transmission electron microscopy</topic><topic>Vacancies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Won, Jonghan</creatorcontrib><creatorcontrib>Valdez, James A.</creatorcontrib><creatorcontrib>Naito, Muneyuki</creatorcontrib><creatorcontrib>Ishimaru, Manabu</creatorcontrib><creatorcontrib>Sickafus, Kurt E.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>METADEX</collection><jtitle>Scripta materialia</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Won, Jonghan</au><au>Valdez, James A.</au><au>Naito, Muneyuki</au><au>Ishimaru, Manabu</au><au>Sickafus, Kurt E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride</atitle><jtitle>Scripta materialia</jtitle><date>2009-05-01</date><risdate>2009</risdate><volume>60</volume><issue>9</issue><spage>799</spage><epage>802</epage><pages>799-802</pages><issn>1359-6462</issn><eissn>1872-8456</eissn><abstract>Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/j.scriptamat.2009.01.023</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
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subjects Displacement
Electron irradiation
Electron microscopy
Fluence
Niobium nitride
Nitrogen atoms
Order–disorder
Phase transformation
Superlattice structures
Transformations
Transmission electron microscopy
Vacancies
title Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-14T07%3A40%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Transmission%20electron%20microscopy%20study%20of%20an%20electron-beam-induced%20phase%20transformation%20of%20niobium%20nitride&rft.jtitle=Scripta%20materialia&rft.au=Won,%20Jonghan&rft.date=2009-05-01&rft.volume=60&rft.issue=9&rft.spage=799&rft.epage=802&rft.pages=799-802&rft.issn=1359-6462&rft.eissn=1872-8456&rft_id=info:doi/10.1016/j.scriptamat.2009.01.023&rft_dat=%3Cproquest_cross%3E33943445%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1082201420&rft_id=info:pmid/&rft_els_id=S1359646209000517&rfr_iscdi=true