Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Transmission electron microscopy study of an electron-beam-induced phase transformation of niobium nitride

Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process...

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Veröffentlicht in:Scripta materialia 2009-05, Vol.60 (9), p.799-802
Hauptverfasser: Won, Jonghan, Valdez, James A., Naito, Muneyuki, Ishimaru, Manabu, Sickafus, Kurt E.
Format: Artikel
Sprache:eng
Schlagworte:
Displacement
Electron irradiation
Electron microscopy
Fluence
Niobium nitride
Nitrogen atoms
Order–disorder
Phase transformation
Superlattice structures
Transformations
Transmission electron microscopy
Vacancies
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Zusammenfassung:Tetragonal γ-NbN 1 − x was irradiated with 300 keV electrons at room temperature to fluences from 1.8 × 10 24–5.4 × 10 26 e/m 2. The superlattice structure in γ-NbN 1 − x was observed using transmission electron microscopy and found to disappear at a fluence of 5.4 × 10 26 e/m 2. During this process, displaced nitrogen atoms occupy vacant sites on the nitrogen sublattice. The final structure is a δ-phase (B1) structure. A randomized arrangement of N vacancies is responsible for the observed γ → δ transformation.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2009.01.023