Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments
Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measureme...
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Veröffentlicht in: | Physica status solidi. C 2008-07, Vol.5 (9), p.3181-3183 |
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creator | Kitamura, Masatoshi Kuzumoto, Yasutaka Kamura, Masakazu Aomori, Shigeru Na, Jong Ho Arakawa, Yasuhiko |
description | Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
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Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><identifier>ISSN: 1862-6351</identifier><identifier>ISSN: 1610-1634</identifier><identifier>EISSN: 1610-1642</identifier><identifier>DOI: 10.1002/pssc.200779209</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>81.05.Tp ; 81.10.Bk ; 81.65.−b ; 85.30.Tv ; 85.65.+h</subject><ispartof>Physica status solidi. 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C</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kitamura, Masatoshi</au><au>Kuzumoto, Yasutaka</au><au>Kamura, Masakazu</au><au>Aomori, Shigeru</au><au>Na, Jong Ho</au><au>Arakawa, Yasuhiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments</atitle><jtitle>Physica status solidi. C</jtitle><addtitle>Phys. Status Solidi (c)</addtitle><date>2008-07</date><risdate>2008</risdate><volume>5</volume><issue>9</issue><spage>3181</spage><epage>3183</epage><pages>3181-3183</pages><issn>1862-6351</issn><issn>1610-1634</issn><eissn>1610-1642</eissn><abstract>Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssc.200779209</doi><tpages>3</tpages></addata></record> |
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title | Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments |
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