Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments

Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measureme...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physica status solidi. C 2008-07, Vol.5 (9), p.3181-3183
Hauptverfasser: Kitamura, Masatoshi, Kuzumoto, Yasutaka, Kamura, Masakazu, Aomori, Shigeru, Na, Jong Ho, Arakawa, Yasuhiko
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 3183
container_issue 9
container_start_page 3181
container_title Physica status solidi. C
container_volume 5
creator Kitamura, Masatoshi
Kuzumoto, Yasutaka
Kamura, Masakazu
Aomori, Shigeru
Na, Jong Ho
Arakawa, Yasuhiko
description Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
doi_str_mv 10.1002/pssc.200779209
format Article
fullrecord <record><control><sourceid>proquest_wiley</sourceid><recordid>TN_cdi_proquest_miscellaneous_33783657</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>33783657</sourcerecordid><originalsourceid>FETCH-LOGICAL-i1899-2438289699ce470f06a72a0f8cd9930447f7d09167a4d246c8e27fb05d1c60283</originalsourceid><addsrcrecordid>eNo9kElPwzAQRiMEEqVw5ZwTN5exndjxEUVsopRWZRFcLJM4rSEbttPSf0-qop5mRvreaOYFwTmGEQYgl61z2YgAcC4IiINggBkGhFlEDvs-YQQxGuPj4MS5LwAaA2aD4H3crNGqKb1aaNS02ipv6kVYdGWpra51mDII_dLUqDBlFXqramecb6wL18Yvw5Wypulc6DpbqEz3Aa18pWvvToOjQpVOn_3XYfByc_2c3qHx0-19ejVGBidCIBLRhCSCCZHpiEMBTHGioEiyXAgKUcQLnoPAjKsoJxHLEk148QlxjjMGJKHD4GK3t7XNT6edl5VxmS5LVev-MkkpTyiLeR8Uu-DalHojW2sqZTcSg9zqk1t9cq9PTufzdD_1LNqx_e_6d88q-y0ZpzyWb5Nb-ZBOH2ezyYd8pX-RGHaK</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>33783657</pqid></control><display><type>article</type><title>Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Kitamura, Masatoshi ; Kuzumoto, Yasutaka ; Kamura, Masakazu ; Aomori, Shigeru ; Na, Jong Ho ; Arakawa, Yasuhiko</creator><creatorcontrib>Kitamura, Masatoshi ; Kuzumoto, Yasutaka ; Kamura, Masakazu ; Aomori, Shigeru ; Na, Jong Ho ; Arakawa, Yasuhiko</creatorcontrib><description>Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</description><identifier>ISSN: 1862-6351</identifier><identifier>ISSN: 1610-1634</identifier><identifier>EISSN: 1610-1642</identifier><identifier>DOI: 10.1002/pssc.200779209</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>81.05.Tp ; 81.10.Bk ; 81.65.−b ; 85.30.Tv ; 85.65.+h</subject><ispartof>Physica status solidi. C, 2008-07, Vol.5 (9), p.3181-3183</ispartof><rights>Copyright © 2008 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fpssc.200779209$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fpssc.200779209$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Kitamura, Masatoshi</creatorcontrib><creatorcontrib>Kuzumoto, Yasutaka</creatorcontrib><creatorcontrib>Kamura, Masakazu</creatorcontrib><creatorcontrib>Aomori, Shigeru</creatorcontrib><creatorcontrib>Na, Jong Ho</creatorcontrib><creatorcontrib>Arakawa, Yasuhiko</creatorcontrib><title>Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments</title><title>Physica status solidi. C</title><addtitle>Phys. Status Solidi (c)</addtitle><description>Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</description><subject>81.05.Tp</subject><subject>81.10.Bk</subject><subject>81.65.−b</subject><subject>85.30.Tv</subject><subject>85.65.+h</subject><issn>1862-6351</issn><issn>1610-1634</issn><issn>1610-1642</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNo9kElPwzAQRiMEEqVw5ZwTN5exndjxEUVsopRWZRFcLJM4rSEbttPSf0-qop5mRvreaOYFwTmGEQYgl61z2YgAcC4IiINggBkGhFlEDvs-YQQxGuPj4MS5LwAaA2aD4H3crNGqKb1aaNS02ipv6kVYdGWpra51mDII_dLUqDBlFXqramecb6wL18Yvw5Wypulc6DpbqEz3Aa18pWvvToOjQpVOn_3XYfByc_2c3qHx0-19ejVGBidCIBLRhCSCCZHpiEMBTHGioEiyXAgKUcQLnoPAjKsoJxHLEk148QlxjjMGJKHD4GK3t7XNT6edl5VxmS5LVev-MkkpTyiLeR8Uu-DalHojW2sqZTcSg9zqk1t9cq9PTufzdD_1LNqx_e_6d88q-y0ZpzyWb5Nb-ZBOH2ezyYd8pX-RGHaK</recordid><startdate>200807</startdate><enddate>200807</enddate><creator>Kitamura, Masatoshi</creator><creator>Kuzumoto, Yasutaka</creator><creator>Kamura, Masakazu</creator><creator>Aomori, Shigeru</creator><creator>Na, Jong Ho</creator><creator>Arakawa, Yasuhiko</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><scope>BSCLL</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>200807</creationdate><title>Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments</title><author>Kitamura, Masatoshi ; Kuzumoto, Yasutaka ; Kamura, Masakazu ; Aomori, Shigeru ; Na, Jong Ho ; Arakawa, Yasuhiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i1899-2438289699ce470f06a72a0f8cd9930447f7d09167a4d246c8e27fb05d1c60283</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>81.05.Tp</topic><topic>81.10.Bk</topic><topic>81.65.−b</topic><topic>85.30.Tv</topic><topic>85.65.+h</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kitamura, Masatoshi</creatorcontrib><creatorcontrib>Kuzumoto, Yasutaka</creatorcontrib><creatorcontrib>Kamura, Masakazu</creatorcontrib><creatorcontrib>Aomori, Shigeru</creatorcontrib><creatorcontrib>Na, Jong Ho</creatorcontrib><creatorcontrib>Arakawa, Yasuhiko</creatorcontrib><collection>Istex</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. C</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kitamura, Masatoshi</au><au>Kuzumoto, Yasutaka</au><au>Kamura, Masakazu</au><au>Aomori, Shigeru</au><au>Na, Jong Ho</au><au>Arakawa, Yasuhiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments</atitle><jtitle>Physica status solidi. C</jtitle><addtitle>Phys. Status Solidi (c)</addtitle><date>2008-07</date><risdate>2008</risdate><volume>5</volume><issue>9</issue><spage>3181</spage><epage>3183</epage><pages>3181-3183</pages><issn>1862-6351</issn><issn>1610-1634</issn><eissn>1610-1642</eissn><abstract>Influence of surface treatment on fullerene C60 thin‐film transistors (TFTs) has been investigated. Phenyltrimethoxysilane (PTS), Hexamethyldisilazane (HMDS) and octadecyltrimethoxysilane (ODS) were used for the surface treatment. The treated surface was investigated by water‐contact‐angle measurement and the C60 deposited on the surface was observed with scanning electron microscope. As a result, C60 TFT with the ODS‐treated insulator exhibited the highest field‐effect mobility of 1.46 cm2/Vs. In addition, the TFTs operated at a low voltage of 5 V by adopting high‐dielectric‐constant gate insulator. (© 2008 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim)</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssc.200779209</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1862-6351
ispartof Physica status solidi. C, 2008-07, Vol.5 (9), p.3181-3183
issn 1862-6351
1610-1634
1610-1642
language eng
recordid cdi_proquest_miscellaneous_33783657
source Wiley Online Library Journals Frontfile Complete
subjects 81.05.Tp
81.10.Bk
81.65.−b
85.30.Tv
85.65.+h
title Low-voltage-operating fullerene C60 thin-film transistors with various surface treatments
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T10%3A15%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_wiley&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Low-voltage-operating%20fullerene%20C60%20thin-film%20transistors%20with%20various%20surface%20treatments&rft.jtitle=Physica%20status%20solidi.%20C&rft.au=Kitamura,%20Masatoshi&rft.date=2008-07&rft.volume=5&rft.issue=9&rft.spage=3181&rft.epage=3183&rft.pages=3181-3183&rft.issn=1862-6351&rft.eissn=1610-1642&rft_id=info:doi/10.1002/pssc.200779209&rft_dat=%3Cproquest_wiley%3E33783657%3C/proquest_wiley%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=33783657&rft_id=info:pmid/&rfr_iscdi=true