Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosa Method

Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosa Method

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 20 on stress measurement with the cosa method was investigated. The experiment...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Sasaki, Toshihiko, Miyazawa, Yohei, Takahashi, Shun-Ichi, Matsuyama, Ryohei, Sasaki, Katsunari, Hiratsuka, Koichi
Format: Tagungsbericht
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 20 on stress measurement with the cosa method was investigated. The experiments were conducted under the conditions of 20=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosa method.
ISSN:0255-5476
DOI:10.4028/www.scientific.net/msf.571-572.249